共 50 条
- [21] The Influence of Flash Lamp Annealing on the Minority Carrier Lifetime of Czochralski Silicon Wafers INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013, 2014, 1583 : 94 - 99
- [25] Warpage measurement of silicon wafers of various bonding areas 2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 1165 - 1168
- [26] Anisotropic warpage of wafers with anodized porous silicon layers PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1999, 175 (02): : R7 - R8
- [27] Comparison of high temperature annealed Czochralski silicon wafers and epitaxial wafers MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 36 (1-3): : 50 - 54
- [28] Warpage at high temperature and mechanical strength of silicon wafers Pan Tao Ti Hsueh Pao, 9 (710-713):
- [30] Influence of a preliminary phosphorus diffusion on the evaluation of the recombination strength of dislocations in Czochralski silicon wafers POLYCRYSTALLINE SEMICONDUCTORS IV - PHYSICS, CHEMISTRY AND TECHNOLOGY, 1996, 51-5 : 117 - 122