Parametric S-Parameter Prediction Using Deep Learning

被引:0
|
作者
Bansal, Vinayak [1 ]
Feng, Lihong [2 ]
de la Rubia, Valentin [3 ]
Benner, Peter [2 ]
机构
[1] Indian Inst Technol, Dept Chem Engn, Delhi, India
[2] Max Planck Inst Dynam Complex Tech Syst, Computat Methods Syst & Control Theory, Magdeburg, Germany
[3] Univ Politecn Madrid, Dept Matemat Aplicada TIC, Madrid, Spain
关键词
S-parameter; convolutional autoencoder; feed-forward neural network;
D O I
10.1109/EPEPS61853.2024.10754126
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
We construct a neural network model of Sparameters, from which the S-parameters can be quickly predicted. Numerical tests on a filter model show that the proposed method accurately predicts the S-parameters with multiple sharp resonances.
引用
收藏
页数:3
相关论文
共 50 条
  • [11] On peculiarities of S-parameter measurements
    Rolain, Yves
    Van Moer, Wendy
    Jargon, Jeffrey A.
    DeGroot, Donald C.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (05) : 1967 - 1972
  • [12] Transistor parameter extraction using DC, S-parameter and noise data simultaneously
    Cai, Q
    Gerber, J
    Daniel, T
    Rohde, UL
    1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES, 1997, : 861 - 864
  • [13] Performing S-parameter measurements
    Sundberg, G
    MICROWAVES & RF, 2001, 40 (06) : 99 - 100
  • [14] Passivity Check of S-Parameter Descriptor Systems via S-Parameter Generalized Hamiltonian Methods
    Zhang, Zheng
    Wong, Ngai
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2010, 33 (04): : 1034 - 1042
  • [15] Parametric modelling of linear time invariant S-parameter devices in the laplace domain.
    Rolain, Y
    Vandersteen, G
    Schreurs, D
    VandenBosch, S
    JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!), 1996, : 1244 - 1249
  • [16] Estimate of Embedded Element Efficiency Using S-Parameter Measurements
    Huffman, Julie
    Kefauver, W. Neill
    Bargeron, James
    2016 IEEE INTERNATIONAL SYMPOSIUM ON PHASED ARRAY SYSTEMS AND TECHNOLOGY (PAST), 2016,
  • [17] Clock grid simulation using transient S-parameter modeling
    Kim, Kyung Ki
    Kim, Yong-Bin
    Park, N.
    Lombardi, F.
    2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5, 2006, : 225 - +
  • [18] Reduction of S-parameter errors using singular spectrum analysis
    Ozturk, Turgut
    Uluer, Ihsan
    Unal, Ilhami
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (07):
  • [19] Forcing causality on S-parameter data using the Hilbert transform
    Perry, PA
    Brazil, TJ
    IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1998, 8 (11): : 378 - 380
  • [20] A Study on Jig Using Microstrip Line for the S-Parameter Method
    Endo, Kazuma
    Sasamori, Takayuki
    Tobana, Teruo
    Isota, Yoji
    2015 IEEE CONFERENCE ON ANTENNA MEASUREMENTS & APPLICATIONS (CAMA), 2015,