High power high efficiency single emitter laser diode with high reliability operation

被引:0
|
作者
Morohashi, R. [1 ]
Uchiyama, M. [1 ]
Kawakami, T. [2 ]
Yamagata, Y. [1 ]
Terada, Y. [1 ]
机构
[1] Fujikura Ltd, Opt Technol R&D Ctr, 1440 Mutsuzaki, Sakura, Chiba 2858550, Japan
[2] Fujikura Ltd, Fiber Laser Div, 1440 Mutsuzaki, Sakura, Chiba 2858550, Japan
关键词
semiconductor laser; high power; waveguide structure; high efficiency;
D O I
10.1109/ISLC57752.2024.10717339
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To maximize output with low vertical divergence of single emitter laser diodes, epitaxial structures were designed and fabricated with two types of waveguide structures. At a driving current of 27 A under room temperature, high power of 27.9 W and high efficiency of 66.5% was achieved. The vertical far-field divergence angle with 95% power intensity of 47 degrees was obtained. The aging test with temperature acceleration passed 3,500 hours without failure.
引用
收藏
页数:2
相关论文
共 50 条
  • [41] High power and high brightness diode laser device
    Gu, Yuan-Yuan
    Peng, Hang-Yu
    Wang, Xiang-Peng
    Shan, Xiao-Nan
    Yin, Hong-He
    Liu, Yun
    Ning, Yong-Qiang
    Wang, Li-Jun
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2009, 38 (03): : 481 - 484
  • [42] High Power Operation of AlGaInP Red Laser Diode for Display Applications
    Kuramoto, K.
    Nishida, T.
    Abe, S.
    Miyashita, M.
    Mori, K.
    Yagi, T.
    HIGH-POWER DIODE LASER TECHNOLOGY AND APPLICATIONS XIII, 2015, 9348
  • [43] OPERATION OF A HIGH-EFFICIENCY IMPATT DIODE
    ZAKHAROV, AL
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1972, 6 (02): : 189 - &
  • [44] Investigation of reliability issues in high power laser diode bar packages
    Dhamdhere, AR
    Malshe, AP
    Schmidt, WF
    Brown, WD
    MICROELECTRONICS RELIABILITY, 2003, 43 (02) : 287 - 295
  • [45] Effective Methods for Evaluation of High Power Laser Diode Quality and Reliability
    Lu, Guoguang
    Xie, Shaofeng
    Huang, Yun
    Cao, Junsheng
    PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II, 2014, : 874 - 877
  • [46] 808 nm Single Emitter High Power Laser with 13.6 W
    Li Peixu
    Yin Fangjun
    Zhang Chengshan
    Kai Beichao
    Sun Sujuan
    Jiang Jianmin
    Xia Wei
    Xu Xiangang
    CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2018, 45 (01):
  • [47] High-reliability high-efficiency 976-nm diode laser pump sources
    Stiers, E
    Kanskar, M
    High-Power Diode Laser Technology and Applications III, 2005, 5711 : 30 - 36
  • [48] High power, high efficiency continuous-wave 808 nm laser diode arrays
    Wang, Zhenfu
    Li, Te
    Yang, Guowen
    Song, Yunfei
    OPTICS AND LASER TECHNOLOGY, 2017, 97 : 297 - 301
  • [49] Emitter failure and thermal facet load in high-power laser diode arrays
    Puchert, R.
    Tomm, J.W.
    Jaeger, A.
    Baerwolff, A.
    Luft, J.
    Spaeth, W.
    Applied Physics A: Materials Science and Processing, 1998, 66 (05): : 483 - 486
  • [50] Emitter failure and thermal facet load in high-power laser diode arrays
    R. Puchert
    J.W. Tomm
    A. Jaeger
    A. Bärwolff
    J. Luft
    W. Späth
    Applied Physics A, 1998, 66 : 483 - 486