Influence of alloying elements on bonding interface of palladium-plated copper wire in humid and high temperature environment

被引:0
|
作者
Wen, Xiaodong [1 ]
Yang, Donghua [2 ]
Hu, Kailun [1 ]
Li, Tao [1 ]
Xia, Daquan [3 ]
Wang, Zhenhua [1 ]
Zhang, Chunhong [1 ]
机构
[1] Chongqing Univ Technol, Coll Mat Sci & Engn, Chongqing, Peoples R China
[2] Chongqing Univ Technol, Chongqing Municipal Engn Res Ctr, Inst Higher Educ Special Welding Mat & Technol, Chongqing, Peoples R China
[3] Chongqing Pingwei Enterprise Co Ltd, Chongqing, Peoples R China
关键词
palladium plated copper wire; trace alloying elements; corrosion resistance; automotive electronics;
D O I
10.1109/ICEPT63120.2024.10668658
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, a new type of palladium plated copper wire (PW-B) is designed and developed independently. This kind of copper wire is to prevent halide corrosion by regulating the trace alloying elements in the copper substrate and adjusting the intermetallic compounds formed at the welding interface with the aluminum pad, so as to improve the reliability of the product. In this paper, high accelerated stress reliability test is carried out to verify the reliability of the material under high temperature and high humidity environment. The results show that PW-B has good reliability in the extreme environment of high temperature, high humidity and halide action, and is expected to be applied in automotive electronics in the future.
引用
收藏
页数:3
相关论文
共 43 条
  • [1] Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
    Zhang, Yuemin
    Guo, Haiyun
    Cao, Jun
    Wu, Xuefeng
    Jia, Hewei
    Chang, Andong
    MICROMACHINES, 2023, 14 (08)
  • [2] Effects of alloying elements in high reliability copper wire bond material for high temperature applications
    Eto, M.
    Araki, N.
    Yamada, T.
    Klengel, R.
    Klengel, S.
    Petzold, M.
    Sugiyama, M.
    Fujimoto, S.
    MICROELECTRONICS RELIABILITY, 2020, 114
  • [3] Bonded strength and reliability under high temperature and humid environment for silver alloy bonding wire
    Cao, Jun
    Hua, Han
    2018 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING AND IMAPS ALL ASIA CONFERENCE (ICEP-IAAC), 2018, : 341 - 345
  • [4] TEM study on interface of palladium coated copper wire bonding on aluminum metallization
    Xu, Hui
    Qin, Ivy
    Shah, Ashish
    Clauberg, Horst
    Chylak, Bob
    Acoff, Viola L.
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 339 - 344
  • [5] High temperature performance study of gold wire bonding on a palladium bonding pad
    Sasangka, Wardhana Aji
    Tan, A. C.
    EPTC 2006: 8TH ELECTRONIC PACKAGING TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2006, : 330 - 335
  • [6] Influence of alloying elements on thermal conductivity and high temperature strength of copper based alloys
    Kim, KT
    Jung, WJ
    Choi, CS
    MATERIALS SCIENCE AND TECHNOLOGY, 2001, 17 (04) : 455 - 458
  • [7] Simulation study on the effect of palladium layer thickness and temperature on the bonding properties of palladium coated copper wire
    An, Bin
    Zhou, Hongliang
    Cao, Jun
    Ming, Pingmei
    Xia, Jie
    Yao, Jingguang
    Persic, John
    MICROELECTRONICS RELIABILITY, 2024, 162
  • [8] Surface-Enhanced Copper Bonding Wire for LSI and Its Bond Reliability under Humid Environment
    Uno, Tomohiro
    Kimura, Keiichi
    Yamada, Takashi
    2009 EUROPEAN MICROELECTRONICS AND PACKAGING CONFERENCE (EMPC 2009), VOLS 1 AND 2, 2009, : 518 - +
  • [9] Investigation of ultrasonic copper wire wedge bonding on Au/Ni plated Cu substrates at ambient temperature
    Tian, Yanhong
    Wang, Chunqing
    Lum, Iuan
    Mayer, M.
    Jung, J. P.
    Zhou, Y.
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2008, 208 (1-3) : 179 - 186
  • [10] Thick Palladium Coated Copper (PCC) Wire BSOB Bonding on a Pre-plated Frame Chip on Lead Package
    Palagud, Jose, Jr.
    Wang, S. W.
    2018 IEEE 38TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY CONFERENCE (IEMT), 2018,