Measurement and Calibration Approaches for Two-Port Scattering Parameters at mK Temperatures

被引:0
|
作者
Oberto, L. [1 ]
Shokrolahzade, E. [2 ]
Enrico, E. [1 ]
Fasolo, L. [1 ]
Celotto, A. [1 ,6 ]
Galvano, B. [1 ,3 ,4 ]
Alocco, A. [1 ,6 ]
Mubarak, F. A. [2 ,5 ]
Spirito, M. [2 ]
机构
[1] Ist Nazl Ric Metrol INRiM, Str Cacce 91, I-10135 Turin, Italy
[2] Delft Univ Technol, Mekelweg 4, NL-2628 CD Delft, Netherlands
[3] Univ Palermo, Piazza Marina 61, Palermo, Italy
[4] CNIT, Viale GP Usberti 181-A, Parma, Italy
[5] Natl Metrol Inst Netherlands VSL, NL-2629 JA Delft, Netherlands
[6] Politecn Torino, DISAT, Corso Duca Abruzzi 24, I-10129 Turin, Italy
关键词
cryogenic electronics; measurement standards; measurement techniques; measurement uncertainty; microwave measurement;
D O I
10.1109/CPEM61406.2024.10646000
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes the set-up and characterization approaches to realize cryogenic scattering parameters measurements. The system developed at the Istituto Nazionale di Ricerca Metrologica (INRiM, Italy), exploits the short-open-load-reciprocal technique, to realize error corrected measurements. The system has been developed in the framework of the EMPIR project 20FUN07 SuperQuant, and it operates at temperatures down to the mK range, in the band 4-12 GHz in coaxial line. Calibration standards are referred to room temperature standards and computer-aided simulations are used to extract their behavior at mK. The first measurements on an actual device (a 20 dB attenuator) are here shown.
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页数:2
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