Measurement and Calibration Approaches for Two-Port Scattering Parameters at mK Temperatures

被引：0

作者：

Oberto, L. ^{[1
]}

Shokrolahzade, E. ^{[2
]}

Enrico, E. ^{[1
]}

Fasolo, L. ^{[1
]}

Celotto, A. ^{[1
,6
]}

Galvano, B. ^{[1
,3
,4
]}

Alocco, A. ^{[1
,6
]}

Mubarak, F. A. ^{[2
,5
]}

Spirito, M. ^{[2
]}

机构：

[1] Ist Nazl Ric Metrol INRiM, Str Cacce 91, I-10135 Turin, Italy

[2] Delft Univ Technol, Mekelweg 4, NL-2628 CD Delft, Netherlands

[3] Univ Palermo, Piazza Marina 61, Palermo, Italy

[4] CNIT, Viale GP Usberti 181-A, Parma, Italy

[5] Natl Metrol Inst Netherlands VSL, NL-2629 JA Delft, Netherlands

[6] Politecn Torino, DISAT, Corso Duca Abruzzi 24, I-10129 Turin, Italy

来源：

2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024 | 2024年

关键词：

cryogenic electronics; measurement standards; measurement techniques; measurement uncertainty; microwave measurement;

D O I：

10.1109/CPEM61406.2024.10646000

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes the set-up and characterization approaches to realize cryogenic scattering parameters measurements. The system developed at the Istituto Nazionale di Ricerca Metrologica (INRiM, Italy), exploits the short-open-load-reciprocal technique, to realize error corrected measurements. The system has been developed in the framework of the EMPIR project 20FUN07 SuperQuant, and it operates at temperatures down to the mK range, in the band 4-12 GHz in coaxial line. Calibration standards are referred to room temperature standards and computer-aided simulations are used to extract their behavior at mK. The first measurements on an actual device (a 20 dB attenuator) are here shown.

引用

页数：2

共 50 条

[21] A CALIBRATION PROCEDURE FOR TWO-PORT VNA WITH THREE MEASUREMENT CHANNELS BASED ON T-MATRIX
Zhao, W.
Qin, H. -B.
Qiang, L.
PROGRESS IN ELECTROMAGNETICS RESEARCH LETTERS, 2012, 29 : 35 - 42
[22] Two-port scattering at an elliptic-waveguide junction
Univ of Hull, Hull, United Kingdom
IEEE Trans Microwave Theory Tech, 8 pt 1 (1255-1262):
[23] Determine two-port S-parameters from one-port measurements using calibration substrate standards
Ou, J
Caggiano, MF
55th Electronic Components & Technology Conference, Vols 1 and 2, 2005 Proceedings, 2005, : 1765 - 1768
[24] ANTENNA REPRESENTATION IN TWO-PORT NETWORK SCATTERING PARAMETER
Prakoso, Teguh
Ngah, Razali
Ghassemlooy, Zabih
Rahman, Tharek Abdul
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2011, 53 (06) : 1404 - 1409
[25] Two-port scattering at an elliptic-waveguide junction
Chan, KL
Judah, SR
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (08) : 1255 - 1262
[26] Two-port calibration of test fixtures with different test ports
Zhen, YC
You, LW
Yu, L
Ning, HZ
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2002, 35 (04) : 299 - 302
[27] Two-port calibration of test fixtures with OSL method.
Chen, ZY
Wang, YL
Liu, Y
Zhu, NH
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, 2002, : 138 - 141
[28] Impedance measurement techniques for one-port and two-port networks
Bai, Mingsian R.
Lo, Yi-Yang
Chen, You Siang
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2015, 138 (04): : 2279 - 2290
[29] Two-port network analyzer calibration using an unknown 'thru'
Ferrero, Andrea
Pisani, Umberto
IEEE Microwave and Guided Wave Letters, 1992, 2 (12): : 505 - 507
[30] Characterization and Modeling of Two-Port Wideband Resistance Calibration Standards
Stevenson, Sarah R.
Delker, Collin J.
Nordquist, Christopher D.
Solomon, Otis M.
Johnson-Wilke, Raegan L.
Ballance, Mark H.
Sandoval, Ricky L.
Harris, C. Thomas
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2021, 31 (04) : 409 - 412

← 1 2 3 4 5 →