Surface Roughness Evaluation with Using White Light Interferometry

被引：0

作者：

Kato, Kenichi ^{[1
,2
]}

Akiyama, Yu ^{[1
,3
]}

Fukamachi, Hiroyuki ^{[1
,4
]}

Matsuda, Koji ^{[1
,5
]}

Mouri, Toshihiko ^{[1
,6
]}

Aoki, Atsuya ^{[1
,7
]}

Ozaki, Yukiko ^{[1
,8
]}

Takeda, Yoshinobu ^{[1
]}

机构：

[1] Japan Powder Metallurgy Association, 3-42-7 Taito, Taito-ku, Tokyo,110-0016, Japan

[2] Diamet Corporation, 3-1-1 Kogane-cho, Higashi-ku, Niigata,950-8640, Japan

[3] Sumitomo Electric Sintered Alloy, Ltd., 2901 Nariwa, Nariwa-cho, Takahashi,716-0192, Japan

[4] FINE SINTER CO., LTD., 1189-11 Nishinohora, Akechi-cho, Kasugai,480-0303, Japan

[5] PORITE CORPORATION, 350 Kamiebukuro, Kumagaya,360-0234, Japan

[6] NTN Advanced Material Corporation, 101 Katsutaba, kanieshinden, Ama-gun, Kanie-cho,497-8541, Japan

[7] NPR-RIKEN CORPORATION, 1111 Nogi, Nogi-machi, Shimotsuga-gun,329-0114, Japan

[8] Osaka University, 1-11 Mihogaoka, Ibaraki,567-0047, Japan

来源：

Funtai Oyobi Fummatsu Yakin/Journal of the Japan Society of Powder and Powder Metallurgy | 2025年 / 72卷

关键词：

Interferometry - Powder metallurgy - Powder metals - Prisms - Sintering - Strain measurement - Velocity measurement;

D O I：

10.2497/jjspm.16C-T11-05

中图分类号：

学科分类号：

摘要：

ISO Standard 23519:2010 defines the surface roughness of sintered metal parts: Rk and Rpk, and it intends to provide relevant surface roughness data regardless of porosity,- however the data reliability tends to be insufficient in practice. The following parameters might influence the surface roughness data in accordance with the standard such as; measuring probe, instruments, filters, and others. The effect of such parameters was investigated and compared with an optical method using white light interferometry. 3 different measuring instruments were used. The measured surfaces of specimens having density of 6.4, 6.8 and 7.2 are punch facing side. In this study, details of the results are presented. ©2025 Japan Society of Powder and Powder Metallurgy.

引用

共 50 条

[21] White light interferometry
Wyant, JC
HOLOGRAPHY: A TRIBUTE TO YURI DENISYUK AND EMMETT LEITH, 2002, 4737 : 98 - 107
[22] Scanning white-light interferometry as a novel technique to quantify the surface roughness of micron-sized particles for inhalation
Adi, Santoso
Adi, Handoko
Chan, Hak-Kim
Young, Paul M.
Traini, Daniela
Yang, Runyu
Yu, Aibing
LANGMUIR, 2008, 24 (19) : 11307 - 11312
[23] Surface roughness evaluation of additive manufactured metallic components from white light images captured using a flexible fiberscope
Haridas, Aswin
Matham, Murukeshan Vadakke
Crivoi, Alexandru
Patinharekandy, Prabhathan
Jen, Tan Ming
Chan, Kelvin
OPTICS AND LASERS IN ENGINEERING, 2018, 110 : 262 - 271
[24] Measurement of Surface Roughness of Aluminum Ground Samples Using White Light Interference Microscope
Sidki, H.M.
Journal of Optics (India), 2001, 30 (04): : 143 - 150
[25] Measurement of surface roughness of aluminum ground samples using white light interference microscope
Sidki, H.M.
Journal of Optics (India), 2001, 30 (04): : 143 - 150
[26] Roughness Measurement of Hole Processing Surface for Mold Steel Using White Light Interferometer
Lee, Seung-Chul
Kim, Kyeong-Suk
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING, 2013, 33 (01) : 73 - 79
[27] White Light Interferometry on Human Blood Film Using White Light Emitting Diode
Pal, Poulomi
Halder, Animesh
Sarkar, Probir Kumar
Polley, Nabarun
Basak, Piyali
Chakrabarti, Subhananda
Chakrabarti, Prantar
Pal, Samir Kumar
2017 2ND INTERNATIONAL CONFERENCE FOR CONVERGENCE IN TECHNOLOGY (I2CT), 2017, : 151 - 154
[28] Determination of surface roughness of plane optical components using quasimonochromatic light source and phase shifting interferometry
Chatterjee, Sanjib
Kumar, Y. Pavan
OPTICAL ENGINEERING, 2015, 54 (06)
[29] Surface Roughness Evaluation of Milled Surfaces by Image Processing of Speckle and White-Light Images
Ali, J. Mahashar
Jailani, H. Siddhi
Murugan, M.
ADVANCES IN MANUFACTURING PROCESSES, ICEMMM 2018, 2019, : 141 - 151
[30] Quantification of periodic surface structures by white-light interferometry
Daniel, C
Mücklich, F
PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY, 2004, 41 (06): : 277 - 285

← 1 2 3 4 5 →