Voltage Control of Perpendicular Magnetic Anisotropy by Resistive Switching through a Ta/HfO2 Bilayer

被引:0
|
作者
Lu, Yu [1 ]
Zhang, Jian [1 ]
Liu, Tianyu [1 ]
Chen, Jiarui [1 ]
Wang, Weihao [1 ]
Wei, Lujun [2 ]
Wu, Di [1 ]
You, Biao [1 ]
Qin, Yu [3 ]
Shen, Yichun [3 ]
Du, Jun [1 ,4 ]
机构
[1] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[2] Nanjing Univ Posts & Telecommun, Sch Sci, Nanjing 210046, Peoples R China
[3] Zhongtian Technol Adv Mat Co Ltd, Nantong 226009, Peoples R China
[4] Nanjing Univ, Natl Key Lab Spintron, Suzhou 215163, Peoples R China
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
resistive switching; perpendicular magnetic anisotropy; bilayer; voltage control; ion migration; IONIC CONTROL; MECHANISMS;
D O I
10.1021/acsaelm.5c00154
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Voltage control of perpendicular magnetic anisotropy (VCPMA) by resistive switching (RS) is an approach for manipulating perpendicular magnetization, which is of significant importance in realizing energy-efficient and high-speed spintronic devices. However, simultaneously achieving good RS performance and effective VCPMA poses a considerable challenge. In this study, we investigated the VCPMA in the RS device with a stack of Pt/Co/Ta/HfO2/Pt. With the aid of Ta's strong oxygen affinity and the high mobility of oxygen ions in the resultant Ta-oxide layer, the insertion of an appropriately thick Ta layer can not only improve the RS performance but also modulate the PMA effectively. When a negative voltage is applied and increased to the "set" voltage, oxygen ions may migrate from the HfO2 layer to the Ta layer, resulting in a transition from the high resistance state (HRS) to the low resistance state (LRS) and a weakening of PMA as well. On the contrary, when a positive voltage is applied and increased to the "reset" voltage, oxygen ions will return to the HfO2 layer, leading to the device switching from LRS to HRS and partial recovery of PMA. This work provides a clue to the design of energy-efficient spintronic devices.
引用
收藏
页码:2963 / 2970
页数:8
相关论文
共 50 条
  • [41] Voltage-controlled magnetic anisotropy enabled by resistive switching
    Salev, Pavel
    Volvach, Iana
    Sasaki, Dayne
    Lapa, Pavel
    Takamura, Yayoi
    Lomakin, Vitaliy
    Schuller, Ivan K.
    PHYSICAL REVIEW B, 2023, 107 (05)
  • [42] Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory
    Meiyun Zhang
    Shibing Long
    Guoming Wang
    Ruoyu Liu
    Xiaoxin Xu
    Yang Li
    Dinlin Xu
    Qi Liu
    Hangbing Lv
    Enrique Miranda
    Jordi Suñé
    Ming Liu
    Nanoscale Research Letters, 9
  • [43] Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory
    Zhang, Meiyun
    Long, Shibing
    Wang, Guoming
    Liu, Ruoyu
    Xu, Xiaoxin
    Li, Yang
    Xu, Dinlin
    Liu, Qi
    Lv, Hangbing
    Miranda, Enrique
    Sune, Jordi
    Liu, Ming
    NANOSCALE RESEARCH LETTERS, 2014, 9
  • [44] Flexible resistive switching memory based on Mn0.20Zn0.80O/HfO2 bilayer structure
    Zhou, Hai
    Fang, Guo-Jia
    Zhu, Yongdan
    Liu, Nishuang
    Li, Meiya
    Zhao, Xing-Zhong
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2011, 44 (44)
  • [45] Voltage-induced switching in magnetic tunnel junctions with perpendicular magnetic anisotropy
    Wang, W. G.
    Chen, C. L.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2013, 46 (07)
  • [46] Resistive switching in TiN/HfxAl1 − xOy/HfO2/TiN and TiN/HfO2/Ti/TiN structures
    Orlov O.M.
    Gornev E.S.
    Shadrin A.V.
    Zaitsev S.A.
    Morozov S.A.
    Zablotskii A.V.
    Russian Microelectronics, 2014, 43 (05) : 328 - 332
  • [47] Nanosecond Magneto-Ionic Control of Magnetism Using a Resistive Switching HfO2 Gate Oxide
    Jeong, Jimin
    Park, Yeon Su
    Kang, Min-Gu
    Park, Byong-Guk
    ADVANCED ELECTRONIC MATERIALS, 2024,
  • [48] Roles of conducting filament and non-filament regions in the Ta2O5 and HfO2 resistive switching memory for switching reliability
    Park, Tae Hyung
    Kim, Hae Jin
    Park, Woo Young
    Kim, Soo Gil
    Choi, Byung Joon
    Hwang, Cheol Seong
    NANOSCALE, 2017, 9 (18) : 6010 - 6019
  • [49] Enhanced resistive switching behaviors of HfO2:Cu film with annealing process
    Guo, Tingting
    Tan, Tingting
    Liu, Zhengtang
    VACUUM, 2015, 114 : 78 - 81
  • [50] Magnetoresistance of conductive filament in Ni/HfO2/Pt resistive switching memory
    Otsuka, Shintaro
    Hamada, Yoshifumi
    Ito, Daisuke
    Shimizu, Tomohiro
    Shingubara, Shoso
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2015, 54 (05)