Transmission Performance and Crosstalk Analysis of TSV array Based on Differential GSSG Layout

被引:0
|
作者
Liu, Cheng [1 ]
Long, Chao [1 ]
Lu, Xiuzhen [1 ]
机构
[1] Shanghai Univ, Sch Microelect, Shanghai, Peoples R China
来源
2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT | 2024年
关键词
Through Silicon Via (TSV); Insertion loss; Coupling noise; Differential signal; SILICON;
D O I
10.1109/ICEPT63120.2024.10668707
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the realm of large-scale 3D integrated circuits, a substantial number of Through-Silicon Vias (TSVs) must be integrated to realize vertical signal transmission. TSV arrays play a crucial role in achieving high-density 3D vertical interconnection. The presence of crosstalk and noise between TSVs can significantly impede transmission performance. Consequently, there has been a notable focus on developing compact, high-performance TSV arrays. In this work, the transmission characteristics and crosstalk noise of TSV arrays based on differential GSSG (Ground-Signal-Signal-Ground) layout are investigated. A series of signal TSV and ground TSV arrays were designed to study the high-frequency performance of different TSV arrays. The simulation outcomes reveal that single TSV exhibit the lowest insertion loss for both signal lines and ground lines. Signal TSV array tends to induce more severe crosstalk compared to single TSV, whereas multiple ground TSVs can enhance noise shielding and ensure signal integrity. Furthermore, the study extensively investigated the influence of aspect ratio and TSV pitch on transmission performance.
引用
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页数:5
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