Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique

被引：0
|
作者：
王玘 [1 ,2 ]
朱晓峰 [2 ]
袁小文 [1 ]
陈长清 [1 ]
罗向东 [2 ]
张波 [2 ]
机构：
[1] Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology
[2] National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of
来源：
Chinese Physics Letters | 2013年 / 30卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TM935 [频率、波形参数的测量及仪表];
学科分类号：
摘要：
A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves,which are scattered by a sub-wavelength periodical metal wire grating.An ultra thin metal body with diameter of 100μm(λ/300)is observed by imaging illuminated by a 10CHz shining source.An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field.
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收藏
页码：187 / 189
页数：3
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