Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique

被引：0

作者：

王玘 ^{[1
,2
]}

朱晓峰 ^{[2
]}

袁小文 ^{[1
]}

陈长清 ^{[1
]}

罗向东 ^{[2
]}

张波 ^{[2
]}

机构：

[1] Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology

[2] National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of

来源：

Chinese Physics Letters | 2013年 / 30卷 / 12期

关键词：

D O I：

暂无

中图分类号：

TM935 [频率、波形参数的测量及仪表];

学科分类号：

摘要：

A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves,which are scattered by a sub-wavelength periodical metal wire grating.An ultra thin metal body with diameter of 100μm(λ/300)is observed by imaging illuminated by a 10CHz shining source.An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field.

引用

页码：187 / 189

页数：3

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