SOME PROPERTIES OF THE PARAMETRIC SYSTEM OF BASIS FUNCTIONS OF THE PROJECTION METHOD.

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Sveshnikov, A.G.

Eremin, Yu.A.

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| 1600年

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The properties of completeness and linear independence of a parametric system of basis functions of a Galerkin-type projection method are investigated. The use of this system in problems of electromagnetic diffraction theory makes it possible to allow for the geometry of the scatterer by means of a special choice of the basis-function parameters.

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