Reduction of iron diffusion in silicon during the epitaxial growth of β-FeSi2 films by use of thin template buffer layers

被引:0
|
作者
Liu, Zhengxin [1 ]
Suzuki, Yasuhito [1 ]
Osamura, Masato [1 ]
Ootsuka, Teruhisa [1 ]
Mise, Takahiro [1 ]
Kuroda, Ryo [2 ,4 ]
Tanoue, Hisao [2 ]
Makita, Yunosuke [2 ]
Wang, Shinan [3 ]
Fukuzawa, Yasuhiro [3 ]
Otogawa, Naotaka [3 ]
Nakayama, Yasuhiko [3 ]
机构
[1] System Engineers' Company, Limited, Yamato, Kanagawa 242-0001, Japan
[2] Natl. Inst. Adv. Indust. Sci./T., AIST Tsukuba Central 2, Umezono 1-1-1, Tsukuba, Ibaraki 305-8568, Japan
[3] Japan Sci./Technology Corporation, AIST Tsukuba West, Onogawa 16-1, Tsukuba, Ibaraki 305-8569, Japan
[4] Nippon Institute of Technology, Saitama 345-8501, Japan
来源
Journal of Applied Physics | 2004年 / 95卷 / 08期
关键词
Annealing - Defects - Diffusion - Epitaxial growth - Grain boundaries - High temperature effects - Iron compounds - Kinetic energy - Leakage currents - Light emitting diodes - Multilayers - Raman scattering - Reduction - Scanning electron microscopy - Sputtering - Transmission electron microscopy;
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学科分类号
摘要
High-quality β-FeSi2 films were fabricated by the facing-target sputtering (FTS) method. It was found that an epitaxial thin β-FeSi2 template buffer layer performed on Si substrate was essential for the epitaxial growth of thick β-FeSi2 film. The mechanism for reducing Fe diffusion into Si was also discussed with respect to the dependence of the β-FeSi2 epitaxial growth temperature on the thickness, the stability of the compound and features of Fe diffusion in Si. The results indicate that a template layer for the growth of thick β-FeSi2 layers is useful for obtaining β-FeSi 2/Si heterojunctions for photosensor and thin film solar cell applications.
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页码:4019 / 4024
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