Artefacts in electron holography

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作者：
Institute for Applied Physics, Dresden University of Technology, D-01062 Dresden, Germany [1 ]
不详 [2 ]
不详 [3 ]
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ULTRAMICROSCOPY | / 1-4卷 / 67-77期
关键词：
Aberrations - Holography - Imaging techniques - Mathematical techniques - Particle optics;
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摘要：
In off-axis electron holography artefacts may arise specific to the method. In particular at high resolution they must be taken into account to obtain reliable results after correction of aberrations. In the following we describe some artefacts which we have found to be most essential so far.
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