共 50 条
- [43] APPLICATION OF SCANNING ELECTRON ACOUSTIC MICROSCOPY (SEAM) TO THE CHARACTERIZATION OF SEMICONDUCTING MATERIALS AND DEVICES INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 675 - 684
- [45] Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy NEW JOURNAL OF PHYSICS, 2009, 11
- [50] STATICS AND DYNAMICS OF FERROELECTRIC DOMAINS STUDIED WITH SCANNING FORCE MICROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (04): : 2451 - 2455