Ferroelectric domains and domain boundaries observed by scanning force microscopy

被引:0
|
作者
Eng, LM [1 ]
Fousek, J [1 ]
Gunter, P [1 ]
机构
[1] PENN STATE UNIV, MAT RES LAB, UNIVERSITY PK, PA 16802 USA
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Splitting of ferroelectric crystals into domains is a bulk phenomenon. However, many investigation methods rely on observations of intersections of domains or domain boundaries with crystal surfaces. Among them scanning force microscopy promises to be one of the most powerful. In this paper we discuss the different modes of operating the scanning force microscope in order to obtain a contrast between domains with antiparallel polarization. TGS has been chosen as a model material both for its suitable cleavage properties and the wealth of previous knowledge about its domain properties. We have found that antiparallel domains - identified by their lenticular shape - are discernible in both the non-contact mode and the friction force mode of imaging. We offer explanation of the origin of contrast, taking into account forces of topographic origin and those connected with spontaneous polarization. Higher resolution studies made it even possible to evaluate the upper limit of the domain wall thickness at the sample surface : the measured value of 8 nm lies considerably below previous estimations which concern crystal bulk. On the other hand, two neighbouring antiparallel domains cannot be revealed in the contact force mode of operation, indicating that they are terminated by one and the same atomically flat plane. Additionally, contact images are found to reflect the history of the TGS crystal surface.
引用
收藏
页码:419 / 426
页数:8
相关论文
共 50 条
  • [1] INVESTIGATION ON FERROELECTRIC DOMAINS AND DOMAIN-WALLS WITH SCANNING FORCE MICROSCOPY
    LUTHI, R
    HAEFKE, H
    MEYER, KP
    MEYER, E
    HOWALD, L
    RUETSCHI, M
    OVERNEY, RM
    GUNTHERODT, HJ
    [J]. HELVETICA PHYSICA ACTA, 1993, 66 (04): : 415 - 416
  • [2] On the imaging mechanism of ferroelectric domains in scanning force microscopy
    Gruverman, A
    Tokumoto, H
    [J]. NANO LETTERS, 2001, 1 (02) : 93 - 95
  • [3] Kinetics of ferroelectric domains investigated by scanning force microscopy
    Likodimos, V
    Labardi, M
    Allegrini, M
    [J]. PHYSICAL REVIEW B, 2000, 61 (21): : 14440 - 14447
  • [4] Nanoscale domain switching and 3-dimensional mapping of ferroelectric domains by scanning force microscopy
    Eng, LM
    Abplanalp, M
    Günter, P
    Güntherodt, HJ
    [J]. JOURNAL DE PHYSIQUE IV, 1998, 8 (P9): : 201 - 204
  • [5] Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy
    Jungk, Tobias
    Hoffmann, Akos
    Soergel, Elisabeth
    [J]. NEW JOURNAL OF PHYSICS, 2009, 11
  • [6] Contrast mechanism for visualization of ferroelectric domains with scanning force microscopy
    Jungk, T.
    Soergel, E.
    [J]. FERROELECTRICS, 2006, 334 : 29 - 34
  • [7] Scanning force microscopy: Application to nanoscale studies of ferroelectric domains
    Gruverman, A
    Auciello, O
    Tokumoto, H
    [J]. INTEGRATED FERROELECTRICS, 1998, 19 (1-4) : 49 - 83
  • [8] SCANNING FORCE MICROSCOPY AS A TOOL FOR NANOSCALE STUDY OF FERROELECTRIC DOMAINS
    Gruverman, Alexei
    Auciello, Orlando
    Hatano, Jun
    Tokumoto, Hiroshi
    [J]. FERROELECTRICS, 1996, 184 : 11 - 20
  • [9] STATICS AND DYNAMICS OF FERROELECTRIC DOMAINS STUDIED WITH SCANNING FORCE MICROSCOPY
    LUTHI, R
    HAEFKE, H
    GUTMANNSBAUER, W
    MEYER, E
    HOWALD, L
    GUNTHERODT, HJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (04): : 2451 - 2455
  • [10] Detection mechanism for ferroelectric domain boundaries with lateral force microscopy
    Jungk, Tobias
    Hoffmann, Akos
    Soergel, Elisabeth
    [J]. APPLIED PHYSICS LETTERS, 2006, 89 (04)