SELF-INTERSTITIAL MIGRATION IN Si IMPLANTED WITH OXYGEN.

被引:0
|
作者
Stoemenos, J. [1 ]
Margail, J. [1 ]
Dupuy, M. [1 ]
Jaussaud, C. [1 ]
机构
[1] CEN, Grenoble, Fr, CEN, Grenoble, Fr
关键词
D O I
暂无
中图分类号
学科分类号
摘要
SEMICONDUCTING SILICON
引用
收藏
页码:42 / 44
相关论文
共 50 条
  • [1] SELF-INTERSTITIAL MIGRATION IN SI IMPLANTED WITH OXYGEN
    STOEMENOS, J
    MARGAIL, J
    DUPUY, M
    JAUSSAUD, C
    PHYSICA SCRIPTA, 1987, 35 (01): : 42 - 44
  • [2] BARRIER TO MIGRATION OF THE SILICON SELF-INTERSTITIAL
    BARYAM, Y
    JOANNOPOULOS, JD
    PHYSICAL REVIEW LETTERS, 1984, 52 (13) : 1129 - 1132
  • [3] Migration energy for the silicon self-interstitial
    Hallén, A
    Keskitalo, N
    Josyula, L
    Svensson, BG
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (01) : 214 - 216
  • [4] Energetics of self-interstitial clusters in Si
    Cowern, NEB
    Mannino, G
    Stolk, PA
    Roozeboom, F
    Huizing, HGA
    van Berkum, JGM
    Cristiano, F
    Claverie, A
    Jaraíz, M
    PHYSICAL REVIEW LETTERS, 1999, 82 (22) : 4460 - 4463
  • [5] Light emitting from the self-interstitial clusters buried in the Si+ self-ion implanted Si films
    OuYang, Lingxi
    Wang, Chong
    Zhou, Mengwei
    Yang, Jie
    Yang, Yu
    MICRO & NANO LETTERS, 2017, 12 (04) : 205 - 208
  • [6] MULTIVACANCIES, INTERSTITIALS, AND SELF-INTERSTITIAL MIGRATION IN SILICON
    PANTELIDES, ST
    IVANOV, I
    SCHEFFLER, M
    VIGNERON, JP
    PHYSICA B & C, 1983, 116 (1-3): : 18 - 27
  • [7] SELF-INTERSTITIAL BONDING CONFIGURATIONS IN GAAS AND SI
    CHADI, DJ
    PHYSICAL REVIEW B, 1992, 46 (15): : 9400 - 9407
  • [8] ELECTRONIC-STRUCTURE OF THE SELF-INTERSTITIAL IN SI
    BOGUSLAWSKI, P
    PAPP, G
    BALDERESCHI, A
    HELVETICA PHYSICA ACTA, 1983, 56 (04): : 895 - 895
  • [9] Migration behavior of self-interstitial defects in tungsten and iron
    Wang, J.
    Hou, Q.
    Zhang, B. L.
    SOLID STATE COMMUNICATIONS, 2021, 325
  • [10] Modeling of self-interstitial clusters and their formation mechanism in Si
    Takeda, S
    Arai, N
    Yamasaki, J
    DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, 1997, 258-2 : 535 - 540