Electrostatic field in microstrip chambers and its influence on detector performance

被引：0

作者：

Florent, J.J. ^{[1
]}

Gaudaen, J. ^{[1
]}

Ropelewski, L. ^{[1
]}

Sauli, F. ^{[1
]}

机构：

[1] CERN, Geneva, Switzerland

来源：

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 1993年 / A329卷 / 1-2期

关键词：

Dielectric materials - Electric fields - Particle beam tracking - Performance;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This paper describes the results of detailed field calculations for microstrip gas chambers. A program was written using the multigrid technique, which allows to do very fast electrical field calculations for two-dimensional geometries. Typical execution times for a problem on a grid with 154000 nodes are 125 s on a SUN IPC and 14 s on the CERN IBM 3090. The speed of this program makes it practical to do field calculations for a variety of geometries, materials and operating conditions. This has allowed us to gain a better understanding of important phenomena for the operation of gas microstrip chambers, such as charging of the dielectric support.

引用

页码：125 / 132

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