Electrostatic field in microstrip chambers and its influence on detector performance

被引：0
|
作者：
Florent, J.J. [1 ]
Gaudaen, J. [1 ]
Ropelewski, L. [1 ]
Sauli, F. [1 ]
机构：
[1] CERN, Geneva, Switzerland
来源：
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 1993年 / A329卷 / 1-2期
关键词：
Dielectric materials - Electric fields - Particle beam tracking - Performance;
D O I：
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中图分类号：
学科分类号：
摘要：
This paper describes the results of detailed field calculations for microstrip gas chambers. A program was written using the multigrid technique, which allows to do very fast electrical field calculations for two-dimensional geometries. Typical execution times for a problem on a grid with 154000 nodes are 125 s on a SUN IPC and 14 s on the CERN IBM 3090. The speed of this program makes it practical to do field calculations for a variety of geometries, materials and operating conditions. This has allowed us to gain a better understanding of important phenomena for the operation of gas microstrip chambers, such as charging of the dielectric support.
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页码：125 / 132
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