Thin film characterization by acoustic microscopy

被引：0
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作者：
Kundu, Tribikram [1 ]
机构：
[1] Univ of Arizona, Tucson, United States
来源：
Integrated Ferroelectrics | 1997年 / 15卷 / 1 -4 pt 2期
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页码：309 / 316
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