共 50 条
- [32] SCANNING LOW ENERGY ELECTRON MICROSCOPY OF DOPED SILICON AT UNITS OF EV RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION, PROCEEDINGS, 2008, : 49 - 50
- [37] SCANNING ELECTRON MICROSCOPY BULLETIN DE LA SOCIETE FRANCAISE MINERALOGIE ET DE CRISTALLOGRAPHIE, 1971, 94 (03): : 195 - &
- [40] INFRARED STUDY OF DOPED POLYACETYLENE ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1982, 183 (MAR): : 101 - POLY