High resolution photoemission study of low-temperature oxidation on the Si(001) surface

被引：0
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作者：
Yeom, Han Woog [1 ]
Uhrberg, Roger [2 ]
机构：
[1] Atom.-scale Surf. Sci. Res. Center, Inst. of Physics and Applied Physics, Yonsei University, Seoul 120-749, Korea, Republic of
[2] Dept. of Phys. and Msrmt. Technology, Linköping University, S-581 83 Linköping, Sweden
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 7 B期
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摘要：
24
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页码：4460 / 4463
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