Thermal effects on the electrical degradation of thin film resistors

被引：0
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作者：
Pennetta, C. [1 ]
Reggiani, L. [2 ]
Kiss, L.B. [3 ]
机构：
[1] Dipartimento di Fisica, Univ. Lecce, Ist. Naz. Fis. della M., Lecce, Italy
[2] Dipto. di Scienza dei Materiali, Univ. Lecce, Ist. Naz. Fis. della M., Lecce, Italy
[3] Material Science Department, Uppsala Univ., Angstrom Lab., B., Uppsala, Sweden
来源：
Physica A: Statistical Mechanics and its Applications | 1999年 / 266卷 / 1-4期
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页码：214 / 217
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