Thermal effects on the electrical degradation of thin film resistors

被引：0

作者：

Pennetta, C. ^{[1
]}

Reggiani, L. ^{[2
]}

Kiss, L.B. ^{[3
]}

机构：

[1] Dipartimento di Fisica, Univ. Lecce, Ist. Naz. Fis. della M., Lecce, Italy

[2] Dipto. di Scienza dei Materiali, Univ. Lecce, Ist. Naz. Fis. della M., Lecce, Italy

[3] Material Science Department, Uppsala Univ., Angstrom Lab., B., Uppsala, Sweden

来源：

Physica A: Statistical Mechanics and its Applications | 1999年 / 266卷 / 1-4期

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D O I：

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摘要：

引用

页码：214 / 217

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