SECONDARY ELECTRON AND ION IMAGING IN SCANNING ION MICROSCOPY.

被引：0
|
作者：
Levi-Setti, Riccardo
机构：
来源：
Scanning Electron Microscopy | 1983年 / v卷 / pt 1期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1 / 22
相关论文
共 50 条
  • [31] SPIN-POLARIZED SCANNING ELECTRON MICROSCOPY.
    Koike, Kazuyuki
    Matsuyama, Hideo
    Todokoro, Hideo
    Hayakawa, Kazunobu
    1600, (24):
  • [32] INSTRUCTION OF REPLICA TECHNIQUES FOR SCANNING ELECTRON MICROSCOPY.
    Crankshaw, Owen S.
    Scanning Electron Microscopy, 1984, (pt 4) : 1731 - 1737
  • [33] Rubidium and Cesium Ion-Induced Electron and Ion Signals for Scanning Ion Microscopy Applications
    Li, Yang
    Xu, Sheng
    Loeber, Thomas H.
    Vredenbregt, Edgar J. D.
    MICROSCOPY AND MICROANALYSIS, 2024, 30 (05) : 817 - 824
  • [34] ANALYSIS OF THE ERRORS IN STEREOMEASUREMENTS IN SCANNING ELECTRON MICROSCOPY.
    Mel'nik, V.N.
    Sokolov, V.N.
    Shebatinov, M.P.
    Ivanchuk, O.M.
    Bulletin of the Academy of Sciences of the U.S.S.R. Physical series, 1986, 51 (03): : 48 - 53
  • [35] Nanoscale Imaging of Collagen Gels with Focused Ion Beam Milling and Scanning Electron Microscopy
    Reese, Shawn P.
    Farhang, Niloofar
    Poulson, Randy
    Parkman, Gennie
    Weiss, Jeffrey A.
    BIOPHYSICAL JOURNAL, 2016, 111 (08) : 1797 - 1804
  • [36] The imaging of surface reactions by scanning tunneling microscopy.
    Madix, RJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 213 : 73 - COLL
  • [37] 3D imaging of diatoms with ion-abrasion scanning electron microscopy
    Hildebrand, Mark
    Kim, Sang
    Shi, Dan
    Scott, Keana
    Subramaniam, Sriram
    JOURNAL OF STRUCTURAL BIOLOGY, 2009, 166 (03) : 316 - 328
  • [38] Revisiting focused ion beam scanning electron microscopy
    Marshall, Andrea G.
    Damo, Steven M.
    Hinton, Antentor, Jr.
    TRENDS IN BIOCHEMICAL SCIENCES, 2023, 48 (06) : 585 - 586
  • [39] In situ ion bombardment technique for scanning electron microscopy
    Hauffe, W
    Opitz, J
    ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 517 - 518
  • [40] Scanning electron microscopy of the surfaces of ion implanted SiC
    Malherbe, Johan B.
    van der Berg, N. G.
    Kuhudzai, R. J.
    Hlatshwayo, T. T.
    Thabethe, T. T.
    Odutemowo, O. S.
    Theron, C. C.
    Friedland, E.
    Botha, A. J.
    Wendler, E.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2015, 354 : 23 - 27
12345