共 50 条
- [21] SECONDARY-ELECTRON EMISSION OF ION-IMPLANTED SEMICONDUCTORS IN SCANNING ELECTRON-MICROSCOPYAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (04): : 349 - 355NSHANIAN, T
- [22] COMPUTERIZED MICROTOMOGRAPHY IN SCANNING ELECTRON MICROSCOPY.Scanning Electron Microscopy, 1985, v : 1109 - 1120Sasov, A.Yu.
- [23] Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion MillingJOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2010, 93 (01) : 48 - 50Gruner, DanielShen, Zhijian
- [24] PROGRESS IN HIGH-RESOLUTION SCANNING ION MICROSCOPY AND SECONDARY ION MASS-SPECTROMETRY IMAGING MICROANALYSISSCANNING ELECTRON MICROSCOPY, 1985, : 535 - 552LEVISETTI, RCROW, GWANG, YL
- [25] Scanning ion conductance microscopy for imaging biological samples in liquid: A comparative study with atomic force microscopy and scanning electron microscopyMICRON, 2012, 43 (12) : 1390 - 1398Ushiki, TatsuoNakajima, MasatoChoi, MyungHoonCho, Sang-JoonIwata, Futoshi
- [26] Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron MicroscopyJOURNAL OF SURFACE INVESTIGATION, 2023, 17 (06): : 1422 - 1438Novikov, Yu. A.
- [27] Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron MicroscopyJournal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2023, 17 : 1422 - 1438Yu. A. Novikov
- [28] SCANNING SECONDARY ION ANALYTICAL MICROSCOPY WITH PARALLEL DETECTIONBIOLOGY OF THE CELL, 1992, 74 (01) : 43 - 50SLODZIAN, GDAIGNE, BGIRARD, FBOUST, FHILLION, F
- [29] Development of environmental scanning electron microscopy electron beam profile imaging with self-assembled monolayers and secondary ion mass spectroscopySCANNING, 1997, 19 (02) : 71 - 74Wight, SGillen, GHerne, T
- [30] ANALYTICAL MICROSCOPY BY SECONDARY ION IMAGING TECHNIQUESJOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (10): : 1119 - 1127CASTAING, RSLODZIAN, G