共 50 条
- [1] Detection and mapping of oxygen in silicon wafers by scanning infrared absorption International Journal of Infrared and Millimeter Waves, 1997, 18 : 491 - 499
- [2] Detection and mapping of oxygen in silicon wafers by scanning infrared absorption INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1997, 18 (02): : 491 - 499
- [9] Infrared characterization of oxygen precipitates in silicon wafers with different concentrations of interstitial oxygen MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 73 (1-3): : 145 - 148
- [10] Low-temperature infrared absorption measurement for oxygen concentration and precipitates in heavily-doped silicon wafers DEFECTS IN ELECTRONIC MATERIALS II, 1997, 442 : 31 - 36