Comment on 'theoretical scanning tunneling microscopy images of the As vacancy on the GaAs(110) surface'

被引:0
|
作者
Harper, J.
Lengel, G.
Allen, R.E.
Weimer, M.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [11] Scanning tunneling microscopy luminescence from nanoscale surface of GaAs(110)
    Guo, X. L.
    Fujita, D.
    Niori, N.
    Sagisaka, K.
    Onishi, K.
    SURFACE SCIENCE, 2007, 601 (22) : 5280 - 5283
  • [12] OCCUPIED AND UNOCCUPIED STATES OF THE GAAS(110) SURFACE AS MEASURED BY SCANNING TUNNELING MICROSCOPY
    MOLLER, R
    FRAXEDAS, J
    BAUR, C
    KOSLOWSKI, B
    DRANSFELD, K
    SURFACE SCIENCE, 1992, 269 : 817 - 822
  • [13] Bias voltage-dependent scanning tunneling microscopy images of a GaAs(110) surface with small Ag clusters
    Jiang, CS
    Nakayama, T
    Aono, M
    APPLIED SURFACE SCIENCE, 1998, 130 : 425 - 430
  • [14] Atomic geometry and theoretical scanning tunneling microscopy images of K chains on InAs(110)
    Yi, H
    Lee, S
    Kim, H
    APPLIED SURFACE SCIENCE, 2004, 237 (1-4) : 200 - 205
  • [15] STEP SMOOTHING AND SURFACE VACANCY REACTIONS ON INP(110) AND GAP(110) OBSERVED BY SCANNING-TUNNELING-MICROSCOPY
    EBERT, P
    URBAN, K
    SURFACE SCIENCE, 1993, 287 : 891 - 895
  • [17] STRUCTURE OF OXYGEN ADSORBED ON THE GAAS(110) SURFACE STUDIED USING SCANNING TUNNELING MICROSCOPY
    STROSCIO, JA
    FEENSTRA, RM
    FEIN, AP
    PHYSICAL REVIEW B, 1987, 36 (14): : 7718 - 7721
  • [18] SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY OF THIN METAL-FILMS ON THE GAAS(110) SURFACE
    SHIH, CK
    FEENSTRA, RM
    MARTENSSON, P
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3379 - 3385
  • [19] OBSERVATION OF INDIUM ON GAAS(110) SURFACES BY SCANNING TUNNELING MICROSCOPY
    SUZUKI, M
    FUKUDA, T
    ULTRAMICROSCOPY, 1992, 42 : 858 - 863
  • [20] STRUCTURE OF CS ON GAAS(110) AS DETERMINED BY SCANNING TUNNELING MICROSCOPY
    FIRST, PN
    DRAGOSET, RA
    STROSCIO, JA
    CELOTTA, RJ
    FEENSTRA, RM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2868 - 2872