OVERVIEW OF BURN-IN TESTING.

被引：0

作者：

Scheppe, William ^{[1
]}

Miller, Russel F. ^{[1
]}

机构：

[1] General Signal, Blue Island, IL, USA, General Signal, Blue Island, IL, USA

来源：

Electri-onics | 1987年 / 33卷 / 07期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 50 条

[31] BURN-IN AND MAINTENANCE POLICIES
MI, J
ADVANCES IN APPLIED PROBABILITY, 1994, 26 (01) : 207 - 221
[32] SEQUENTIAL BURN-IN PROCEDURES
SPIZZICHINO, F
JOURNAL OF STATISTICAL PLANNING AND INFERENCE, 1991, 29 (1-2) : 187 - 197
[33] BURN-IN AND MIXED POPULATIONS
BLOCK, HW
MI, J
SAVITS, TH
JOURNAL OF APPLIED PROBABILITY, 1993, 30 (03) : 692 - 702
[34] SOME RESULTS ON BURN-IN
BLOCK, HW
MI, J
SAVITS, TH
STATISTICA SINICA, 1994, 4 (02) : 525 - 533
[35] Burn-in and its applications
Mi, J
ZEITSCHRIFT FUR ANGEWANDTE MATHEMATIK UND MECHANIK, 1996, 76 : 227 - 230
[36] Wafer level burn-in
Conti, DR
Van Horn, J
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS, 2000, : 815 - 821
[37] AN OXIDE BURN-IN MODEL
MOAZZAMI, R
HU, CM
1989 SYMPOSIUM ON VLSI TECHNOLOGY: DIGEST OF TECHNICAL PAPERS, 1989, : 77 - 78
[38] Bathtub functions and burn-in
Block, HW
Jong, YK
Savits, TH
PROBABILITY IN THE ENGINEERING AND INFORMATIONAL SCIENCES, 1999, 13 (04) : 497 - 507
[39] LSI BURN-IN AND TEST
不详
ELECTRONIC PRODUCTS MAGAZINE, 1980, 22 (09): : 43 - 46
[40] On a better burn-in procedure
Cha, JH
JOURNAL OF APPLIED PROBABILITY, 2000, 37 (04) : 1099 - 1103