LSI BURN-IN AND TEST

被引：0

作者：

不详

机构：

来源：

ELECTRONIC PRODUCTS MAGAZINE | 1980年 / 22卷 / 09期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：43 / 46

页数：4

共 50 条

[1] Single chip test and burn-in
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[6] Burn-in, burn-in: DC inferno
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[10] Additional Rambus burn-in test sockets
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