Theoretical modeling of obliquely crossed photothermal deflection for thermal conductivity measurements of thin films

被引:0
|
作者
Li, B.C. [1 ]
Zhang, S.Y. [1 ]
机构
[1] Inst. Acoust./Lab. of Mod. Acoust., Nanjing University, Nanjing 210093, China
来源
International Journal of Thermophysics | 1998年 / 19卷 / 2 SPEC.ISS.期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:615 / 624
相关论文
共 50 条
  • [31] Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films
    Kusiak, Andrzej
    Martan, Jiri
    Battaglia, Jean-Luc
    Daniel, Rostislav
    THERMOCHIMICA ACTA, 2013, 556 : 1 - 5
  • [32] Photothermal measurements on optical thin films
    Welsch, E.
    Ristau, D.
    Applied Optics, 1995, 34 (31): : 7239 - 7253
  • [33] THERMAL-CONDUCTIVITY OF THIN-FILMS - MEASUREMENTS AND UNDERSTANDING
    CAHILL, DG
    FISCHER, HE
    KLITSNER, T
    SWARTZ, ET
    POHL, RO
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1259 - 1266
  • [34] Thermal conductivity measurements on thin films based on micromechanical devices
    Jansen, E
    Obermeier, E
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1996, 6 (01) : 118 - 121
  • [35] Investigation of thermal and optical properties of thin WO3 films by the photothermal Deflection Technique
    Gaied, I.
    Dabbous, S.
    Ben Nasrallah, T.
    Yacoubi, N.
    15TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA (ICPPP15), 2010, 214
  • [36] Thermal conductivity measurements of thin amorphous silicon films by scanning thermal microscopy
    Volz, S
    Feng, X
    Fuentes, C
    Guérin, P
    Jaouen, M
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2002, 23 (06) : 1645 - 1657
  • [37] Thermal Conductivity Measurements of Thin Amorphous Silicon Films by Scanning Thermal Microscopy
    S. Volz
    X. Feng
    C. Fuentes
    P. Guérin
    M. Jaouen
    International Journal of Thermophysics, 2002, 23 : 1645 - 1657
  • [38] PHOTOTHERMAL DEFLECTION ANALYSIS OF UV OPTICAL THIN-FILMS
    SCHMID, A
    SMITH, D
    GUARDALBEN, M
    ABATE, J
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 476 : 136 - 142
  • [39] METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENTS BASED ON PHOTOTHERMAL DEFLECTION
    BERTOLOTTI, M
    LIAKHOU, G
    LIVOTI, R
    MICHELOTTI, F
    SIBILIA, C
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (12) : 7078 - 7084
  • [40] Thermal diffusivity measurement of thin wires using photothermal deflection
    Barkyoumb, J.H., 1600, American Inst of Physics, Woodbury, NY, United States (78):