Photothermal measurements on optical thin films

被引：0
|
作者：
Welsch, E. [1 ]
Ristau, D. [2 ]
机构：
[1] Physikalisch-Astronomisch-Technikwissenschaftliche Fakultät, Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany
[2] Laserkomponenten, Laser-Zentrum Hannover e.V., Hollerithallee 8, 30419 Hannover, Germany
来源：
Applied Optics | 1995年 / 34卷 / 31期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Thin films
引用
收藏
页码：7239 / 7253
相关论文
共 50 条
  • [1] PHOTOTHERMAL MEASUREMENTS ON OPTICAL THIN-FILMS
    WELSCH, E
    RISTAU, D
    APPLIED OPTICS, 1995, 34 (31) : 7239 - 7253
  • [2] Photothermal Absorption Measurement on Optical Thin Films
    Welsch, E.
    Laser und Optoelektronik, 29 (01):
  • [3] PHOTOTHERMAL CHARACTERIZATION OF OPTICAL THIN-FILMS
    WU, ZL
    KUO, PK
    WEI, LH
    GU, SL
    THOMAS, RL
    THIN SOLID FILMS, 1993, 236 (1-2) : 191 - 198
  • [4] PRECISION OPTICAL MEASUREMENTS ON THIN FILMS
    BENNETT, HE
    BENNETT, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1967, 4 (05): : 323 - &
  • [5] Photothermal measurements on amorphous thin films deposited on crystalline silicon
    Seas, A
    Christofides, C
    Munidasa, M
    APPLIED PHYSICS LETTERS, 1996, 68 (04) : 538 - 540
  • [6] OPTICAL MEASUREMENTS IN THIN DIELECTRIC FILMS
    CLAPHAM, PB
    VACUUM, 1966, 16 (05) : 253 - &
  • [7] Photothermal radiometric and spectroscopic measurements on silicon nitride thin films
    Nestoros, M
    Gutierrez-Llorente, A
    Othonos, A
    Christofides, C
    Martinez-Duart, JM
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (12) : 6215 - 6219
  • [8] PHOTOTHERMAL DEFLECTION ANALYSIS OF UV OPTICAL THIN-FILMS
    SCHMID, A
    SMITH, D
    GUARDALBEN, M
    ABATE, J
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 476 : 136 - 142
  • [9] Optical measurements of strain and stress in thin films
    Tamulevicius, S
    Augulis, L
    Laukaitis, G
    INTERNATIONAL CONFERENCE ON SOLID STATE CRYSTALS 2000: EPILAYERS AND HETEROSTRUCTURES IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY, 2001, 4413 : 242 - 247
  • [10] MECHANICAL MEASUREMENTS ON OPTICAL THIN-FILMS
    EMILIANI, G
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1989, 44 (245): : 87 - 88
12345