Atomic force microscopy study of small-size nanotubular polymer thin films

被引：0
|
作者：
Chinese Acad of Sciences, Beijing, China [1 ]
机构：
来源：
J Mater Res | / 3卷 / 1084-1090期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Acoustics and atomic force microscopy for the mechanical characterization of thin films
    Daniele Passeri
    Andrea Bettucci
    Marco Rossi
    Analytical and Bioanalytical Chemistry, 2010, 396 : 2769 - 2783
  • [32] Magnetic force microscopy and atomic force microscopy study of Co alloy films
    Lee, GM
    Kim, KW
    Lee, YP
    Joo, HW
    Jeon, D
    Chang, GS
    Whang, CN
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1997, 31 : S74 - S78
  • [33] Atomic force microscopy study of grain evolution during growth of thin oxide films
    Czerwinski, F
    Szpunar, JA
    GRAIN GROWTH IN POLYCRYSTALLINE MATERIALS II, PTS 1 AND 2, 1996, 204- : 729 - 734
  • [34] Conductive Atomic Force Microscopy Study of Local Electronic Transport in ZnTe Thin Films
    Kshirsagar, Sachin D.
    Krishna, M. Ghanashyam
    Tewari, Surya P.
    SOLID STATE PHYSICS, VOL 57, 2013, 1512 : 642 - 643
  • [35] Surface morphological study of J-aggregate thin films by atomic force microscopy
    Daehne, L
    Tao, J
    Mao, GZ
    LANGMUIR, 1998, 14 (02) : 565 - 568
  • [36] Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study
    Passeri, D.
    Bettucci, A.
    Biagioni, A.
    Rossi, M.
    Alippi, A.
    Tamburri, E.
    Lucci, M.
    Davoli, I.
    Berezina, S.
    ULTRAMICROSCOPY, 2009, 109 (12) : 1417 - 1427
  • [37] Extrinsic size effect in piezoresponse force microscopy of thin films
    Morozovska, Anna N.
    Svechnikov, Sergei V.
    Eliseev, Eugene A.
    Kalinin, Sergei V.
    PHYSICAL REVIEW B, 2007, 76 (05)
  • [38] A thin subsurface layer of a polymer film studied by atomic force microscopy
    V. I. Trigub
    A. V. Plotnov
    A. N. Kiselev
    Technical Physics Letters, 2001, 27 : 1041 - 1043
  • [39] A thin subsurface layer of a polymer film studied by atomic force microscopy
    Trigub, VI
    Plotnov, AV
    Kiselev, AN
    TECHNICAL PHYSICS LETTERS, 2001, 27 (12) : 1041 - 1043
  • [40] Atomic force microscopy study of rubbed polyimide films
    Devlin, CLH
    Glab, SD
    Chaing, S
    Russell, TP
    JOURNAL OF APPLIED POLYMER SCIENCE, 2001, 80 (09) : 1470 - 1477
12345