Built-in test module for fault isolation

被引：0
|
作者：
机构：
[1] Vasanthavada, Nagesh
[2] Kanopoulos, Nick
来源：
Vasanthavada, Nagesh | 1600年 / 06期
关键词：
Built-in Testing - Faulty Chips Isolation - Go/No-Go Testing - Signature Analysis - Testing Switch Architecture;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] A BUILT-IN TEST MODULE FOR FAULT ISOLATION
    VASANTHAVADA, N
    KANOPOULOS, N
    IEEE DESIGN & TEST OF COMPUTERS, 1989, 6 (03): : 58 - 65
  • [2] FAULT DETECTION ISOLATION RESULTS FROM AAFIS HARDWARE BUILT-IN TEST
    BENOWITZ, N
    CALHOUN, DF
    LEE, GWK
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1976, 12 (03) : 418 - 418
  • [3] Built-in Test Design for Fault Detection and Isolation in an Aircraft Environmental Control System
    Palmer, Kyle A.
    Hale, William T.
    Han Lu
    Jacobson, Clas A.
    Bollas, George M.
    IFAC PAPERSONLINE, 2016, 49 (07): : 7 - 12
  • [4] Hierarchical test generation with built-in fault diagnosis
    Stroobandt, D
    VanCampenhout, J
    PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 22 - 28
  • [5] Built-in test engine and fault simulation for memory
    McEvoy, P
    Farrell, R
    VLSI Circuits and Systems II, Pts 1 and 2, 2005, 5837 : 742 - 753
  • [6] EBIST: A novel test generator with built-in fault detection capability
    Pradhan, DK
    Liu, CS
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2005, 24 (09) : 1457 - 1466
  • [7] Built-In Test Selection Methodology for Optimal Reliability Fault Coverage
    Brown, Justin
    Barkley, John
    67TH ANNUAL RELIABILITY & MAINTAINABILITY SYMPOSIUM (RAMS 2021), 2021,
  • [8] Intelligent Built-in Test Fault Diagnosis and Prediction for Mechatronics Equipment
    Guo Ming-wei
    Ni Shi-hong
    Zhu Jia-hai
    MEASURING TECHNOLOGY AND MECHATRONICS AUTOMATION IV, PTS 1 AND 2, 2012, 128-129 : 164 - 167
  • [9] EBIST: A novel test generator with built-in fault detection capability
    Pradhan, DK
    Liu, CS
    Chakraborty, K
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, 2003, : 224 - 229
  • [10] Design of Built-In Tests for Active Fault Detection and Isolation of Discrete Faults
    Hale, William T.
    Bollas, George M.
    IEEE ACCESS, 2018, 6 : 50959 - 50973
12345