LOW FREQUENCY DISPERSION IN THICK-FILM CAPACITORS WITH RUTILE-GLASS INSULATION.

Results of investigations obtained when evaluating thick-film capacitors with rutile insulation are given. The structure metal-TiO//2 plus glass-metal contained TiO//2 in the dielectric from 0-95% with respect to weight. The electrodes were made of Pd-Ag, Pt-Au and Ag, whereas the capacitors were protected either with silicon varnish or glass. The frequency responses of the capacitor under various ambient conditions were estimated and effective values of the dielectric complex permittivity calculated. Special attention was paid to the dielectric properties within a range of ultra-low frequencies 1-10** minus **3 Hz. Relaxation phenomena were found when the dielectric comprised rutile. It was demonstrated that the influence of the type of electrode on the relaxation phenomena is relatively insignificant. It is postulated that some mechanism of conductivity and polarization systems predominate in different frequency ranges. The basic mechanisms are the ion-relaxation process and the hopping system of conductivity.