A two-wave X-ray reflectometer

被引:0
|
作者
Tur'yanskij, A.G. [1 ]
Vinogradov, A.V. [1 ]
Pirshin, I.V. [1 ]
机构
[1] Lebedev Inst of Physics, RAS, Moscow, Russia
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:105 / 112
相关论文
共 50 条
  • [31] X-ray and optical wave mixing
    T. E. Glover
    D. M. Fritz
    M. Cammarata
    T. K. Allison
    Sinisa Coh
    J. M. Feldkamp
    H. Lemke
    D. Zhu
    Y. Feng
    R. N. Coffee
    M. Fuchs
    S. Ghimire
    J. Chen
    S. Shwartz
    D. A. Reis
    S. E. Harris
    J. B. Hastings
    Nature, 2012, 488 : 603 - 608
  • [32] X-ray and optical wave mixing
    Glover, T. E.
    Fritz, D. M.
    Cammarata, M.
    Allison, T. K.
    Coh, Sinisa
    Feldkamp, J. M.
    Lemke, H.
    Zhu, D.
    Feng, Y.
    Coffee, R. N.
    Fuchs, M.
    Ghimire, S.
    Chen, J.
    Shwartz, S.
    Reis, D. A.
    Harris, S. E.
    Hastings, J. B.
    NATURE, 2012, 488 (7413) : 603 - +
  • [33] Development of an EUV reflectometer using a laser-plasma x-ray source
    Kondo, H
    Kandaka, N
    Sugisaki, K
    Oshino, T
    Shiraishi, M
    Ishiyama, W
    Murakami, K
    ADVANCES IN LABORATORY-BASED X-RAY SOURCES AND OPTICS, 2000, 4144 : 76 - 81
  • [34] A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry
    T. Matsushita
    E. Arakawa
    Y. Niwa
    Y. Inada
    T. Hatano
    T. Harada
    Y. Higashi
    K. Hirano
    K. Sakurai
    M. Ishii
    M. Nomura
    The European Physical Journal Special Topics, 2009, 167 : 113 - 119
  • [35] A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry
    Matsushita, T.
    Arakawa, E.
    Niwa, Y.
    Inada, Y.
    Hatano, T.
    Harada, T.
    Higashi, Y.
    Hirano, K.
    Sakurai, K.
    Ishii, M.
    Nomura, M.
    EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 2009, 167 : 113 - 119
  • [36] Compact high-precision soft X-ray and extreme ultraviolet reflectometer
    Ni, Qi-Liang
    Liu, Shi-Jie
    Chen, Bo
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2008, 16 (10): : 1886 - 1890
  • [37] Development of EUV reflectometer using a laser-plasma x-ray source
    Kondo, H
    Kandaka, N
    Sugisaki, K
    Oshino, T
    Shiraishi, M
    Ishiyama, W
    Murakami, K
    MICROPROCESSES AND NANOTECHNOLOGY 2000, DIGEST OF PAPERS, 2000, : 34 - 35
  • [38] Time dependence of X-ray yield for two crystal X-ray generators
    Shafroth, SM
    Kruger, W
    Brownridge, JD
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 422 (1-3): : 1 - 4
  • [39] Two-wave interaction in ideal magnetohydrodynamics
    Zaqarashvili, T. V.
    Roberts, B.
    ASTRONOMY & ASTROPHYSICS, 2006, 452 (03) : 1053 - 1058
  • [40] LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings
    Henriksen, P. L.
    Christensen, F. E.
    Massahi, S.
    Ferreira, D. D. M.
    Svendsen, S.
    Jafari, A.
    Shortt, B.
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY IX, 2019, 11119