LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings

被引：4
|
作者：
Henriksen, P. L. [1 ]
Christensen, F. E. [1 ]
Massahi, S. [1 ]
Ferreira, D. D. M. [1 ]
Svendsen, S. [1 ]
Jafari, A. [1 ]
Shortt, B. [2 ]
机构：
[1] Tech Univ Denmark, DTU Space, Bygn 327, DK-2800 Lyngby, Denmark
[2] European Space Agcy ESTEC, Keplerlaan 1,POB 299, NL-2200 AG Noordwijk, Netherlands
来源：
OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY IX | 2019年 / 11119卷
关键词：
LEXR; ATHENA; X-ray optics; X-ray reflectometry; thin-film characterization; X-ray telescopes; grazing incidence; coatings;
D O I：
10.1117/12.2528144
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
Qualification of coating performance at the low-energy range of the Advanced Telescope for High Energy Astrophysics (ATHENA) is important to ensure that the mirror coatings satisfy the performance criteria required to meet ATHENA's science objectives. We report on the design, implementation, and expected performance of a state-of-the-art Low-Energy X-ray Reflectometer (LEXR) acquired with the purpose of qualifying the soft energy X-ray performance of mirror coatings for ATHENA. The reflectometer components are housed in a vacuum chamber and utilizes a microfocus Al source with custom made Kirkpatrick-Baez mirrors and W/Si monochromator to produce a collimated beam of 1.487 keV photons. The system has been designed with source interchangeability, allowing reconfiguration to an 8.048 keV reflectometer using a Cu source or other energies with sources such as Fe, Mg, etc. Several mirror samples can be mounted on a motorized stage, and a 2D CCD camera is used to obtain spatially resolved detection.
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页数：9
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