共 50 条
- [42] Transmission electron microscopy sample preparation and analysis of semiconductor devices ADVANCES AND APPLICATIONS IN THE METALLOGRAPHY AND CHARACTERIZATION OF MATERIALS AND MICROELECTRONIC COMPONENTS: PROCEEDINGS OF THE TWENTY-EIGHTH ANNUAL TECHNICAL MEETING OF THE INTERNATIONAL METALLOGRAPHIC SOCIETY, 1996, 23 : 285 - 290
- [43] Optically oriented electron spin transmission across ferromagnet/semiconductor interfaces SPINTRONICS IV, 2011, 8100
- [44] In situ electrochemical scanning/transmission electron microscopy of electrode–electrolyte interfaces MRS Bulletin, 2020, 45 : 738 - 745
- [48] Energy-filtered transmission electron microscopy of mineral interfaces. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U1208 - U1208
- [49] TRANSMISSION ELECTRON-MICROSCOPY STUDY OF COPPER-CERAMIC INTERFACES JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1986, 11 (02): : A46 - A46