共 50 条
- [43] Modelling the dielectric function of thin films measured by spectroscopic ellipsometry: determination of microstructure and density Fresenius' journal of analytical chemistry, 1995, 353 (5-8): : 556 - 558
- [44] Characterization and dielectric properties of fluorinated amorphous carbon measured by capacitance-voltage response and spectroscopic ellipsometry AMORPHOUS AND NANOSTRUCTURED CARBON, 2000, 593 : 341 - 346
- [45] DENSITY OF AMORPHOUS-GERMANIUM FILMS BY SPECTROSCOPIC ELLIPSOMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 577 - 582
- [47] Evaluation of Pre-Amorphous Layer by Spectroscopic Ellipsometry ION IMPLANTATION TECHNOLOGY 2008, 2008, 1066 : 190 - +
- [50] Model dielectric function of amorphous materials including Urbach tail MICROWAVE AND OPTICAL TECHNOLOGY 2003, 2003, 5445 : 301 - 305