APPARATUS FOR X-RAY DIFFRACTION IN ULTRAHIGH VACUUM.

被引：0
|
作者：
Fuoss, P.H.
Robinson, I.K.
机构：
来源：
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 1983年 / 222卷 / 1-2期
关键词：
SURFACES; -; Microanalysis;
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学科分类号：
摘要：
The authors have constructed an instrument that allows a solid surface, prepared with established ultrahigh vacuum (UHV) procedures, to be examined by X-ray diffraction. The greatest advantage of X-ray diffraction as a surface probe lies in the high angular resolution attainable with a synchrotron source. Therefore, compromising the precision of the diffractometer by isolating the sample from the vacuum chamber on a bellows and sliding teflon seal has been avoided. A manipulator, built into the sample stage, ensures great flexibility of surface analytical and preparatory techniques.
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页码：171 / 176
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