APPARATUS FOR X-RAY DIFFRACTION IN ULTRAHIGH VACUUM.

被引：0
|
作者：
Fuoss, P.H.
Robinson, I.K.
机构：
来源：
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 1983年 / 222卷 / 1-2期
关键词：
SURFACES; -; Microanalysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The authors have constructed an instrument that allows a solid surface, prepared with established ultrahigh vacuum (UHV) procedures, to be examined by X-ray diffraction. The greatest advantage of X-ray diffraction as a surface probe lies in the high angular resolution attainable with a synchrotron source. Therefore, compromising the precision of the diffractometer by isolating the sample from the vacuum chamber on a bellows and sliding teflon seal has been avoided. A manipulator, built into the sample stage, ensures great flexibility of surface analytical and preparatory techniques.
引用
收藏
页码：171 / 176
相关论文
共 50 条
  • [31] INSTRUMENT FOR MEASUREMENTS WITH STANDING X-RAY WAVEFIELDS IN ULTRA-HIGH VACUUM.
    Funke, P.
    Materlik, G.
    Reimann, A.
    Nuclear instruments and methods in physics research, 1985, A246 (1-3): : 763 - 767
  • [32] X-ray vacuum diffraction at finite spatiotemporal offset
    Karbstein, Felix
    Weernink, Ricardo R. Q. P. T. Oude
    PHYSICAL REVIEW D, 2021, 104 (07)
  • [33] Force microscopy experiments in ultrahigh vacuum.
    Meyer, E
    Bennewitz, R
    Bammerlin, M
    Guggisberg, M
    Loppacher, C
    Barwich, V
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 217 : U626 - U626
  • [34] APPARATUS FOR VACUUM X-RAY FLUORESCENCE ANALYSIS OF LIGHT ELEMENTS
    BIRKS, LS
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (12): : 891 - 894
  • [35] Ptychographic X-ray Microscopy with the Vacuum Imaging Apparatus HORST
    Gorniak, Thomas
    Rosenhahn, Axel
    ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS, 2014, 228 (10-12): : 1089 - 1104
  • [36] Apparatus for X-ray diffraction microscopy and tomography of cryo specimens
    Beetz, T
    Howells, MR
    Jacobsen, C
    Kao, CC
    Kirz, J
    Lima, E
    Mentes, TO
    Miao, H
    Sanchez-Hanke, C
    Sayre, D
    Shapiro, D
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 545 (1-2): : 459 - 468
  • [37] An ultrafast X-ray diffraction apparatus for the study of shock waves
    Funk, DJ
    Meserole, CA
    Hof, DE
    Fisher, GL
    Roberts, J
    Taylor, AJ
    Lee, HJ
    Workman, J
    McCulloch, Q
    SHOCK COMPRESSION OF CONDENSED MATTER - 2003, PTS 1 AND 2, PROCEEDINGS, 2004, 706 : 1155 - 1158
  • [38] APPARATUS FOR STUDY OF EXTRINSIC PHOTOEFFECT WITH X-RAY DIFFRACTION.
    Aleksandrov, P.A.
    Bresler, E.E.
    Bugrov, D.A.
    Zashkvara, V.V.
    Imamov, R.M.
    Pashaev, E.M.
    Red'kin, V.S.
    Instruments and experimental techniques New York, 1986, 29 (1 pt 2): : 229 - 233
  • [39] APPARATUS AND TECHNIQUES FOR PRACTICAL CHEMICAL IDENTIFICATION BY X-RAY DIFFRACTION
    SMITH, CS
    BARRETT, RL
    JOURNAL OF APPLIED PHYSICS, 1947, 18 (02) : 177 - 191
  • [40] Ultrahigh-vacuum-compatible diffractometer for soft X-ray scattering
    Lee, J. -S.
    Seung, B. H.
    Khim, T. -Y.
    Jang, H.
    Ko, K. -T.
    Park, B. -G.
    Park, J. -H.
    Lee, K. -B.
    Kim, J. -Y.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 52 (06) : 1814 - 1817
12345