Observation of macrodefects in silicon by the methods of X-ray topography

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Mil'vidskij, M.G.
Osip'yan, Yu.A.
Smirnova, I.A.
Suvorov, E.V.
Shulakov, E.V.
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Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya | 2001年 / 06期
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