Observation of macrodefects in silicon by the methods of X-ray topography

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作者：

Mil'vidskij, M.G.

Osip'yan, Yu.A.

Smirnova, I.A.

Suvorov, E.V.

Shulakov, E.V.

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Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya | 2001年 / 06期

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页码：5 / 12

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