共 50 条
- [1] AUGER-ELECTRON EMISSION UNDER ION-BEAM SHADOWING CONDITIONS JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (11): : 1440 - 1444
- [2] ION-INDUCED AUGER ELECTRONS EMITTED FROM MgO AND GaP UNDER SHADOWING CONDITIONS. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1986, 25 (12): : 1751 - 1755
- [3] ELECTRON AND ION-BEAM EFFECTS IN AUGER-ELECTRON SPECTROMETRY RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 64 (1-4): : 109 - 109
- [4] ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 283 - 283
- [5] ELECTRON AND ION-BEAM EFFECTS IN AUGER-ELECTRON SPECTROSCOPY ON INSULATING MATERIALS RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1983, 79 (1-4): : 291 - 303
- [6] ION-BEAM ANGLE DEPENDENCE OF COLLISIONALLY EXCITED AUGER-ELECTRON EMISSION FROM AL AND SI SURFACES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1159 - 1160
- [7] THE INFLUENCES OF ELECTRON AND ION-BEAM CONDITIONS ON AUGER CARBON LINE-SHAPES ACQUIRED ON DIAMOND AND DLC FILMS SURFACE & COATINGS TECHNOLOGY, 1995, 71 (01): : 37 - 44
- [8] Analysis of potential ion-electron emission for different conditions. ISDEIV - XVIITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, PROCEEDINGS, VOLS I AND II, 1996, : 793 - 795
- [9] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (03): : 214 - 214
- [10] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 54 - 54