Proton damage effects in linear integrated circuits

被引：0
|
作者：
Rax, B.G. [1 ]
Johnston, A.H. [1 ]
Lee, C.I. [1 ]
机构：
[1] California Inst of Technology, Pasadena, United States
来源：
IEEE Transactions on Nuclear Science | 1998年 / 45卷 / 6 pt 1期
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Number:; -; Acronym:; NASA; Sponsor: National Aeronautics and Space Administration;
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页码：2632 / 2637
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