Proton damage effects in linear integrated circuits

被引：0

|

作者：

Rax, B.G. ^{[1
]}

Johnston, A.H. ^{[1
]}

Lee, C.I. ^{[1
]}

机构：

[1] California Inst of Technology, Pasadena, United States

来源：

IEEE Transactions on Nuclear Science | 1998年 / 45卷 / 6 pt 1期

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Number:; -; Acronym:; NASA; Sponsor: National Aeronautics and Space Administration;

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页码：2632 / 2637

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