Study of the iterative elliptic-polarized measurement of optical parameters of multi-layered thin films

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作者
Zhang, Weijia [1 ]
Rong, Ailun [1 ]
机构
[1] Beijing Univ of Aeronautics and, Astronautics, Beijing, China
关键词
Elliptic polarized measurement - Optical disk - Optical parameters;
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(Edited Abstract)
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页码:1 / 11
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