Study of the iterative elliptic-polarized measurement of optical parameters of multi-layered thin films

被引：0
|
作者：
Zhang, Weijia [1 ]
Rong, Ailun [1 ]
机构：
[1] Beijing Univ of Aeronautics and, Astronautics, Beijing, China
来源：
Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics | 1993年 / 04期
关键词：
Elliptic polarized measurement - Optical disk - Optical parameters;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：1 / 11
相关论文
共 50 条
  • [31] Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures
    Joo, Woo-Deok
    You, Joonho
    Ghim, Young-Sik
    Kim, Seung-Woo
    INTERFEROMETRY XIV: TECHNIQUES AND ANALYSIS, 2008, 7063
  • [32] Numerical modeling of short-pulse laser interactions with Multi-layered thin metal films
    Majchrzak, E.
    Mochnacki, B.
    Greer, A.L.
    Suchy, J.S.
    CMES - Computer Modeling in Engineering and Sciences, 2009, 41 (02): : 131 - 146
  • [33] Numerical Modeling of Short-Pulse Laser Interactions with Multi-Layered Thin Metal Films
    Majchrzak, E.
    Mochnacki, B.
    Greer, A. L.
    Suchy, J. S.
    CMES-COMPUTER MODELING IN ENGINEERING & SCIENCES, 2009, 41 (02): : 131 - 146
  • [34] Preparation and Humidity Sensitivity of Multi-Layered Zirconia Thin Films by Sol-Gel Method
    Su, Meiying
    Wang, Jing
    SENSOR LETTERS, 2011, 9 (02) : 670 - 674
  • [35] Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy
    Satoh, Nobuo
    Katori, Shigetaka
    Kobayashi, Kei
    Matsushige, Kazumi
    Yamada, Hirofumi
    IEICE TRANSACTIONS ON ELECTRONICS, 2015, E98C (02): : 91 - 97
  • [36] MEASUREMENT OF THE REFRACTIVE-INDEX PROFILE IN MULTI-LAYERED SEMICONDUCTOR STRUCTURES AND OPTICAL WAGEGUIDES.
    Bogdankevich, O.V.
    Georgobiani, A.N.
    Darznek, S.A.
    Zheleznikova, E.A.
    Solin, V.G.
    Todua, P.A.
    1600,
  • [37] Study on optical thin film parameters measurement method
    Science and Technology on Surface Engineering Laboratory, Lanzhou Institute of Space Technology and Physics, Lanzhou
    730000, China
    Hongwai yu Jiguang Gongcheng Infrared Laser Eng., 3 (1048-1052):
  • [38] Langmuir-Blodgett assembly of sulphonated graphene nanosheets into single- and multi-layered thin films
    Jia, Baoping
    Zou, Linda
    CHEMICAL PHYSICS LETTERS, 2013, 568 : 101 - 105
  • [39] Modeling of relaxation of viscoelastic stresses in multi-layered thin films/substrate systems due to thermal mismatch
    Hsueh, Hsiang-Chun
    Chiang, Donyau
    Lee, Sanboh
    THIN SOLID FILMS, 2010, 518 (24) : 7497 - 7500
  • [40] Photo-electrochemical properties of multi-layered thin films composed of chalcogenide and superionic conductor glasses
    Kawamura, J
    Iriyama, J
    Nakamura, Y
    SOLID STATE IONICS, 1996, 90 (1-4) : 303 - 306
12345