Study of the iterative elliptic-polarized measurement of optical parameters of multi-layered thin films

被引：0
|
作者：
Zhang, Weijia [1 ]
Rong, Ailun [1 ]
机构：
[1] Beijing Univ of Aeronautics and, Astronautics, Beijing, China
来源：
Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics | 1993年 / 04期
关键词：
Elliptic polarized measurement - Optical disk - Optical parameters;
D O I：
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学科分类号：
摘要：
(Edited Abstract)
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页码：1 / 11
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