On-chip test scheme for SRAMs

被引：0

作者：

Lala, P.K. ^{[1
]}

Walker, A. ^{[1
]}

机构：

[1] North Carolina A&T State Univ, Greensboro, United States

来源：

| 1994年

关键词：

Random access storage;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：16 / 20

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